VLSI test principles and architectures : (Record no. 11124)

000 -LEADER
fixed length control field 02279cam a22003854a 4500
001 - CONTROL NUMBER
control field u8398
003 - CONTROL NUMBER IDENTIFIER
control field SA-PMU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20210418125044.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 060227s2006 ne a b 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2006006869
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Language of cataloging eng
Transcribing agency DLC
Modifying agency BAKER
-- C#P
-- IXA
-- YDXCP
-- IG#
-- OCLCQ
-- BTCTA
-- LVB
-- UBA
-- STF
-- DEBBG
-- UWW
-- OCLCQ
-- DEBSZ
-- OCLCQ
-- OCLCF
-- OCLCO
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0123705975 (hardcover : alk. paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780123705976 (hardcover : alk. paper)
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)64624834
042 ## - AUTHENTICATION CODE
Authentication code pcc
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7874.75
Item number .V587 2006
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.39/5
Edition number 22
245 00 - TITLE STATEMENT
Title VLSI test principles and architectures :
Remainder of title design for testability /
Statement of responsibility, etc. edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Amsterdam ;
-- Boston :
Name of publisher, distributor, etc. Elsevier Morgan Kaufmann Publishers,
Date of publication, distribution, etc. c2006.
300 ## - PHYSICAL DESCRIPTION
Extent xxx, 777 p. :
Other physical details ill. ;
Dimensions 25 cm.
490 1# - SERIES STATEMENT
Series statement The Morgan Kaufmann series in systems on silicon
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Design for testability / Laung-Terng (L.-T.) Wang, Xiaoqing Wen, and Khader S. Abdel-Hafez -- Logic and fault simulation / Jiun-Lang Huang, James C.-M. Li, and Duncan M. (Hank) Walker -- Test generation / Michael S. Hsiao -- Logic built-in self-test / Laung-Terng (L.-T.) Wang -- Test compression / Xiaowei Li, Kuen-Jong Lee, and Nur A. Touba -- Logic diagnosis / Shi-Yu Huang -- Memory testing and built-in self-test / Cheng-Wen Wu -- Memory diagnosis and built-in self-repair / Cheng-Wen Wu -- Boundary scan and core-based testing / Kuen-Jong Lee -- Analog and mixed-signal testing / Chauchin Su -- Test technology trends in the nanometer age / Kwang-Ting (Tim) Cheng, Wen-Ben Jone, and Laung-Terng (L.-T.) Wang.
596 ## -
-- 1 2
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Design.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wang, Laung-Terng.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wu, Cheng-Wen,
Titles and other words associated with a name EE Ph. D.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wen, Xiaoqing.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Morgan Kaufmann series in systems on silicon.
856 41 - ELECTRONIC LOCATION AND ACCESS
Materials specified Table of contents
Uniform Resource Identifier <a href="http://catdir.loc.gov/catdir/toc/ecip069/2006006869.html">http://catdir.loc.gov/catdir/toc/ecip069/2006006869.html</a>
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified Publisher description
Uniform Resource Identifier <a href="http://catdir.loc.gov/catdir/enhancements/fy0632/2006006869-d.html">http://catdir.loc.gov/catdir/enhancements/fy0632/2006006869-d.html</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
994 ## -
-- Z0
-- SUPMU
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type Public note
          Female Library Female Library 04/18/2021   TK7874.75 .V587 2006 51952000171874 04/15/2021 1 04/15/2021 Books STACKS
          Main Library Main Library 04/18/2021   TK7874.75 .V587 2006 51952000147817 04/15/2021 1 04/15/2021 Books STACKS