Micro and nano mechanical testing of materials and devices / (Record no. 7327)

000 -LEADER
fixed length control field 02158cam a22003258a 4500
001 - CONTROL NUMBER
control field u5065
003 - CONTROL NUMBER IDENTIFIER
control field SA-PMU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20210418124332.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 080226s2008 nyua b 001 0 eng
040 ## - CATALOGING SOURCE
Original cataloging agency UKM
Language of cataloging eng
Transcribing agency UKM
Modifying agency BTCTA
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-- YDXCP
-- OCLCG
-- CDX
-- BWX
-- GZM
-- IAY
-- SOI
-- HEBIS
-- DEBBG
-- OCL
-- DEBSZ
-- OCLCQ
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780387787008 (hbk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0387787003 (hbk.)
028 52 - PUBLISHER OR DISTRIBUTOR NUMBER
Publisher or distributor number 11971023
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)214306579
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7875
Item number .M53 2008
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Edition number 22
245 00 - TITLE STATEMENT
Title Micro and nano mechanical testing of materials and devices /
Statement of responsibility, etc. Fuqian Yang, James C.M. Li, editors.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York :
Name of publisher, distributor, etc. Springer,
Date of publication, distribution, etc. c2008.
300 ## - PHYSICAL DESCRIPTION
Extent xiii, 387 p. :
Other physical details ill. ;
Dimensions 24 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Principles and applications of indentation / Mototsugu Sakai -- Size effects in nanoindentation / Xue Feng, Yonggang Huang, and Keh-chih Hwang -- Indentation in shape memory alloys / Yang-Tse Cheng and David S. Grummon -- Adhesive contact of solid surfaces / Fuqian Yang -- Nanomechanical characterization of one-dimensional nanostructures / Yousheng Zhang ... [et al.] -- Deformation behavior of nanoporous metals / Juergen Biener, Andrea M. Hodge, and Alex V. Hamza -- Residual stress determination using nanoindentation technique / Zhi-Hui Xu and Xiaodong Li -- Piezoelectric response in the contact deformation of piezoelectric materials / Fuqian Yang -- Mechanics of carbon nanotubes and their composites / Liang Chi Zhang -- Microbridge tests / Tong-Yi Zhang -- Nanoscale testing of one-dimensional nanostructures / Bei Peng ... [et al.] -- Metrologies for mechanical response of micro-and nanoscale systems / Robert R. Keller ... [et al.] -- Mechanical characterization of low-dimensional structures through on-chip tests / Alberto Corigliano, Fabrizio Cacchoine, and Sarah Zerbini.
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650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Materials
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectromechanical systems
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanoelectromechanical systems
General subdivision Testing.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Yang, Fuqian.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Li, James C. M.
Fuller form of name (James Chen-Min),
Dates associated with a name 1925-
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
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Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type Public note
          Main Library Main Library 04/18/2021   TK7875 .M53 2008 51952000122203 04/15/2021 1 04/15/2021 Books STACKS