000 -LEADER |
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02158cam a22003258a 4500 |
001 - CONTROL NUMBER |
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u5065 |
003 - CONTROL NUMBER IDENTIFIER |
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SA-PMU |
005 - DATE AND TIME OF LATEST TRANSACTION |
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20210418124332.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
080226s2008 nyua b 001 0 eng |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
UKM |
Language of cataloging |
eng |
Transcribing agency |
UKM |
Modifying agency |
BTCTA |
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BAKER |
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YDXCP |
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OCLCG |
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CDX |
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BWX |
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GZM |
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IAY |
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SOI |
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HEBIS |
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DEBBG |
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OCL |
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DEBSZ |
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OCLCQ |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780387787008 (hbk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0387787003 (hbk.) |
028 52 - PUBLISHER OR DISTRIBUTOR NUMBER |
Publisher or distributor number |
11971023 |
035 ## - SYSTEM CONTROL NUMBER |
System control number |
(OCoLC)214306579 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TK7875 |
Item number |
.M53 2008 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.381 |
Edition number |
22 |
245 00 - TITLE STATEMENT |
Title |
Micro and nano mechanical testing of materials and devices / |
Statement of responsibility, etc. |
Fuqian Yang, James C.M. Li, editors. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New York : |
Name of publisher, distributor, etc. |
Springer, |
Date of publication, distribution, etc. |
c2008. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xiii, 387 p. : |
Other physical details |
ill. ; |
Dimensions |
24 cm. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references and index. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Principles and applications of indentation / Mototsugu Sakai -- Size effects in nanoindentation / Xue Feng, Yonggang Huang, and Keh-chih Hwang -- Indentation in shape memory alloys / Yang-Tse Cheng and David S. Grummon -- Adhesive contact of solid surfaces / Fuqian Yang -- Nanomechanical characterization of one-dimensional nanostructures / Yousheng Zhang ... [et al.] -- Deformation behavior of nanoporous metals / Juergen Biener, Andrea M. Hodge, and Alex V. Hamza -- Residual stress determination using nanoindentation technique / Zhi-Hui Xu and Xiaodong Li -- Piezoelectric response in the contact deformation of piezoelectric materials / Fuqian Yang -- Mechanics of carbon nanotubes and their composites / Liang Chi Zhang -- Microbridge tests / Tong-Yi Zhang -- Nanoscale testing of one-dimensional nanostructures / Bei Peng ... [et al.] -- Metrologies for mechanical response of micro-and nanoscale systems / Robert R. Keller ... [et al.] -- Mechanical characterization of low-dimensional structures through on-chip tests / Alberto Corigliano, Fabrizio Cacchoine, and Sarah Zerbini. |
596 ## - |
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1 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials |
General subdivision |
Testing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Microelectromechanical systems |
General subdivision |
Testing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanoelectromechanical systems |
General subdivision |
Testing. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Yang, Fuqian. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Li, James C. M. |
Fuller form of name |
(James Chen-Min), |
Dates associated with a name |
1925- |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Books |
994 ## - |
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Z0 |
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SUPMU |