Introduction to quantum metrology : quantum standards and instrumentation / Waldemar Nawrocki.
Material type:
TextLanguage: English Original language: Polish Publisher: Cham : Springer, [2015]Copyright date: ©2015Description: xiii, 279 pages : illustrations (some color) ; 24 cmContent type: text Media type: unmediated Carrier type: volumeISBN: 9783319156682; 3319156683Uniform titles: Wstęp do metrologii kwantowej. English Subject(s): Physical measurements | Quantum theory | Physical measurements | Quantum theoryDDC classification: 530.8 | Item type | Current library | Call number | Copy number | Status | Notes | Date due | Barcode |
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Books
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Female Library | QC39 .N38 2015 (Browse shelf (Opens below)) | 1 | Available | STACKS | 51952000317739 | |
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Books
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Main Library | QC39 .N38 2015 (Browse shelf (Opens below)) | 1 | Available | STACKS | 51952000317722 |
Includes bibliographical references and index.
Theoretical Background of Quantum Metrology -- Measures, Standards and Systems of Units -- The New SI System of Units - The Quantum SI -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Scanning Probe Microscopes -- New Standards of Mass.
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