SIGMETRICS 2010 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 14-18, 2010, New York, New York, USA / sponsored by ACM SIGMETRICS.

By: International Conference on Measurement and Modeling of Computer Systems (2010 : New York, N.Y.)Contributor(s): ACM-SigmetricsMaterial type: TextTextSeries: Performance evaluation review: v. 38, no. 1.Publisher: New York, N.Y. : Association for Computing Machinery, c2010Description: xii, 386 p. : ill. ; 28 cmOther title: International Conference on Measurement and Modeling of Computer Systems | Proceedings--ACM SIGMETRICS 2010 [Spine title] | Also known as: SIGMETRICS '10Subject(s): Computer networks -- Evaluation -- Congresses | Electronic digital computers -- Evaluation -- Congresses
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