000 02279cam a22003854a 4500
001 u8398
003 SA-PMU
005 20210418125044.0
008 060227s2006 ne a b 001 0 eng
010 _a 2006006869
040 _aDLC
_beng
_cDLC
_dBAKER
_dC#P
_dIXA
_dYDXCP
_dIG#
_dOCLCQ
_dBTCTA
_dLVB
_dUBA
_dSTF
_dDEBBG
_dUWW
_dOCLCQ
_dDEBSZ
_dOCLCQ
_dOCLCF
_dOCLCO
020 _a0123705975 (hardcover : alk. paper)
020 _a9780123705976 (hardcover : alk. paper)
035 _a(OCoLC)64624834
042 _apcc
050 0 0 _aTK7874.75
_b.V587 2006
082 0 0 _a621.39/5
_222
245 0 0 _aVLSI test principles and architectures :
_bdesign for testability /
_cedited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
260 _aAmsterdam ;
_aBoston :
_bElsevier Morgan Kaufmann Publishers,
_cc2006.
300 _axxx, 777 p. :
_bill. ;
_c25 cm.
490 1 _aThe Morgan Kaufmann series in systems on silicon
504 _aIncludes bibliographical references and index.
505 0 _aDesign for testability / Laung-Terng (L.-T.) Wang, Xiaoqing Wen, and Khader S. Abdel-Hafez -- Logic and fault simulation / Jiun-Lang Huang, James C.-M. Li, and Duncan M. (Hank) Walker -- Test generation / Michael S. Hsiao -- Logic built-in self-test / Laung-Terng (L.-T.) Wang -- Test compression / Xiaowei Li, Kuen-Jong Lee, and Nur A. Touba -- Logic diagnosis / Shi-Yu Huang -- Memory testing and built-in self-test / Cheng-Wen Wu -- Memory diagnosis and built-in self-repair / Cheng-Wen Wu -- Boundary scan and core-based testing / Kuen-Jong Lee -- Analog and mixed-signal testing / Chauchin Su -- Test technology trends in the nanometer age / Kwang-Ting (Tim) Cheng, Wen-Ben Jone, and Laung-Terng (L.-T.) Wang.
650 0 _aIntegrated circuits
_xVery large scale integration
_xTesting.
650 0 _aIntegrated circuits
_xVery large scale integration
_xDesign.
700 1 _aWang, Laung-Terng.
700 1 _aWu, Cheng-Wen,
_cEE Ph. D.
700 1 _aWen, Xiaoqing.
830 0 _aMorgan Kaufmann series in systems on silicon.
856 4 1 _3Table of contents
_uhttp://catdir.loc.gov/catdir/toc/ecip069/2006006869.html
856 4 2 _3Publisher description
_uhttp://catdir.loc.gov/catdir/enhancements/fy0632/2006006869-d.html
942 _cBOOK
994 _aZ0
_bSUPMU
596 _a1 2
999 _c11124
_d11124