000			01770cam a22003614a 4500
001			u8873
003			SA-PMU
005			20210418123354.0
008			061011s2003 enka b 001 0 eng
010			_a 2006284184
040			_aUKM _beng _cUKM _dDLC _dTXA _dUNA _dDAY _dBAKER _dYDXCP _dBTCTA _dBDX _dOCLCF _dOCLCO
020			_a0852969996
020			_a9780852969991
035			_a(OCoLC)48884836
042			_apcc
050	0	0	_aTK7878.4 _b.K795 2003
082	0	4	_a621.381548 _221
100	1		_aKularatna, Nihal.
245	1	0	_aDigital and analogue instrumentation : _btesting and measurement / _cNihal Kularatna.
260			_aLondon : _bInstitution of Electrical Engineers, _cc2003.
300			_axxix, 645 p. : _bill. ; _c25 cm.
490	1		_aIEE electrical measurement series ; _vv. 11
504			_aIncludes bibliographical references and index.
505	0		_aIntroduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments.
650		0	_aElectronic instruments _xTesting.
710	2		_aInstitution of Electrical Engineers.
830		0	_aIEE electrical measurement series ; _vv. 11.
856	4	1	_3Table of contents only _uhttp://catdir.loc.gov/catdir/enhancements/fy0651/2006284184-t.html
856	4	2	_3Publisher description _uhttp://catdir.loc.gov/catdir/enhancements/fy0651/2006284184-d.html
942			_cBOOK
994			_aZ0 _bSUPMU
596			_a1
999			_c2749 _d2749