000			02158cam a22003258a 4500
001			u5065
003			SA-PMU
005			20210418124332.0
008			080226s2008 nyua b 001 0 eng
040			_aUKM _beng _cUKM _dBTCTA _dBAKER _dYDXCP _dOCLCG _dCDX _dBWX _dGZM _dIAY _dSOI _dHEBIS _dDEBBG _dOCL _dDEBSZ _dOCLCQ
020			_a9780387787008 (hbk.)
020			_a0387787003 (hbk.)
028	5	2	_a11971023
035			_a(OCoLC)214306579
050		4	_aTK7875 _b.M53 2008
082	0	4	_a621.381 _222
245	0	0	_aMicro and nano mechanical testing of materials and devices / _cFuqian Yang, James C.M. Li, editors.
260			_aNew York : _bSpringer, _cc2008.
300			_axiii, 387 p. : _bill. ; _c24 cm.
504			_aIncludes bibliographical references and index.
505	0		_aPrinciples and applications of indentation / Mototsugu Sakai -- Size effects in nanoindentation / Xue Feng, Yonggang Huang, and Keh-chih Hwang -- Indentation in shape memory alloys / Yang-Tse Cheng and David S. Grummon -- Adhesive contact of solid surfaces / Fuqian Yang -- Nanomechanical characterization of one-dimensional nanostructures / Yousheng Zhang ... [et al.] -- Deformation behavior of nanoporous metals / Juergen Biener, Andrea M. Hodge, and Alex V. Hamza -- Residual stress determination using nanoindentation technique / Zhi-Hui Xu and Xiaodong Li -- Piezoelectric response in the contact deformation of piezoelectric materials / Fuqian Yang -- Mechanics of carbon nanotubes and their composites / Liang Chi Zhang -- Microbridge tests / Tong-Yi Zhang -- Nanoscale testing of one-dimensional nanostructures / Bei Peng ... [et al.] -- Metrologies for mechanical response of micro-and nanoscale systems / Robert R. Keller ... [et al.] -- Mechanical characterization of low-dimensional structures through on-chip tests / Alberto Corigliano, Fabrizio Cacchoine, and Sarah Zerbini.
650		0	_aMaterials _xTesting.
650		0	_aMicroelectromechanical systems _xTesting.
650		0	_aNanoelectromechanical systems _xTesting.
700	1		_aYang, Fuqian.
700	1		_aLi, James C. M. _q(James Chen-Min), _d1925-
942			_cBOOK
994			_aZ0 _bSUPMU
596			_a1
999			_c7327 _d7327